Volume 44, Issue 4 p. 233-238
Research article

The structure of two-layered objects reconstructed using EDXRF-analysis and internal X-ray ratios

Roberto Cesareo

Corresponding Author

Roberto Cesareo

Università di Sassari, Sassari, Italy

Correspondence to: Roberto Cesareo, Institute of Mathematics and Physics, Università di Sassari, via Nulauro 3, 07041 Alghero, Sassari, Italy. E-mail: [email protected]Search for more papers by this author
Giovanni Buccolieri

Giovanni Buccolieri

Dipartimento di Matematica e Fisica, Università del Salento, Lecce, Italy

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Alfredo Castellano

Alfredo Castellano

Dipartimento di Matematica e Fisica, Università del Salento, Lecce, Italy

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Ricardo T. Lopes

Ricardo T. Lopes

COPPE, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

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Joaquim T. De Assis

Joaquim T. De Assis

Universidade Estadual do Rio de Janeiro, Nova Friburgo, Brazil

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Stefano Ridolfi

Stefano Ridolfi

ARS MENSURAE, Rome, Italy

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Antonio Brunetti

Antonio Brunetti

Università di Sassari, Sassari, Italy

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Angel Bustamante

Angel Bustamante

University of San Marcos, Lima, Peru

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First published: 25 March 2015
Citations: 24
Presented at the European Conference on X-Ray Spectrometry, Bologna, Italy, 15-20 June 2014.

Abstract

Many objects of common use (tools, utensils, metals, knick-knacks, dishes and glasses) and artifacts (for example paintings of all types) are composed of two or more layers. In many cases, it would be useful to determine the correct location, composition and thickness of the various layers.

Non-destructive and non-invasive methods are described, based on energy-dispersive X-ray fluorescence which are able to ‘reconstruct' the complete structure of a multilayered sample. These methods use, in different ways, the ratios of characteristic X-rays emitted by the elements of the layers, and, in particular, two effects can be usefully employed, effects which are based on the differential attenuation of Kα and Kβ or Lα and Lβ X-rays:

  1. Different self-attenuation of K or L X-rays emitted by an element characterizing a layer because of the different energy of the two K or L X-rays;
  2. Different attenuation of the two K or L X-rays of an element characterizing a layer by a second superimposed layer.

Furthermore, the ratio of the Kα (or Lα) X-rays emitted by an element characterizing the internal layer, to the Kα (or Lα) X-rays emitted by an element characterizing a second superimposed layer, can also be employed in the ‘reconstruction’ of the layers.

In this paper, the theoretical background of all these methods is described, and typical examples are shown. Copyright © 2015 John Wiley & Sons, Ltd.