Volume 18, Issue 3 p. 210-216
Research Article

A tandem SIMS study of poly(vinyl methyl ether)

G. J. Leggett

G. J. Leggett

The Centre for Surface and Materials Analysis, Department of Chemistry, UMIST, PO Box 88, Sackville St., Manchester M20 0UZ, UK

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A. Chilkoti

A. Chilkoti

National ESCA and Surface Analysis Center for Biomedical Problems, Department of Chemical Engineering, BF-10, University of Washington, Seattle, WA 98195, USA

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B. D. Ratner

B. D. Ratner

National ESCA and Surface Analysis Center for Biomedical Problems, Department of Chemical Engineering, BF-10, University of Washington, Seattle, WA 98195, USA

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J. C. Vickerman

J. C. Vickerman

The Centre for Surface and Materials Analysis, Department of Chemistry, UMIST, PO Box 88, Sackville St., Manchester M20 0UZ, UK

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First published: March 1992
Citations: 6

Abstract

Results are presented for a tandem-SIMS investigation of the fragmentation patterns of secondary ions sputtered from the surface of poly(vinyl methyl ether) (PVME). A complete fragmentation sequence is deduced which is capable of explaining the formation of most of the major ions observed in the SIMS spectrum in terms of fragmentation steps proceeding from the largest secondary ion observed. The fragmentation steps involved in the formation of these ions are discussed and the secondary ion structures are identified.