Poly(vinylpyrrolidone)-stabilized silver nanoparticles for strained-silicon surface enhanced Raman spectroscopy
Corresponding Author
Stuart J. Corr
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland.Search for more papers by this authorLisa O'Reilly
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
Search for more papers by this authorEoghan P. Dillon
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Search for more papers by this authorAndrew R. Barron
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Search for more papers by this authorPatrick J. McNally
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
Search for more papers by this authorCorresponding Author
Stuart J. Corr
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland.Search for more papers by this authorLisa O'Reilly
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
Search for more papers by this authorEoghan P. Dillon
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Search for more papers by this authorAndrew R. Barron
The Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA
Search for more papers by this authorPatrick J. McNally
Nanomaterials Processing Laboratory, (The RINCE Institute), Dublin City University, Dublin 9, Ireland
Search for more papers by this authorAbstract
Poly(vinylpyrrolidone)-stabilized silver nanoparticles deposited onto strained-silicon layers grown on graded Si1−xGex virtual substrates are utilized for selective amplification of the Si–Si vibration mode of strained silicon via surface-enhanced Raman scattering spectroscopy. This solution-based technique allows rapid, highly sensitive and accurate characterization of strained silicon whose Raman signal would usually be overshadowed by the underlying bulk SiGe Raman spectra. The analysis was performed on strained silicon samples of thickness 9, 17.5 and 42 nm using a 488 nm Ar+ micro-Raman excitation source. The quantitative determination of strained-silicon enhancement factors was also made. Copyright © 2011 John Wiley & Sons, Ltd.
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