Volume 29, Issue 5 p. 368-380

Understanding the neostriatal microcircuitry: High-voltage electron microscopy

Charles J. Wilson

Corresponding Author

Charles J. Wilson

Department of Anatomy, University of Tennessee, Memphis, Memphis, Tennessee 38163

Department of Anatomy and Neurobiology, University of Tennessee, Memphis, 875 Monroe Avenue, Memphis, TN 38163Search for more papers by this author
First published: 1 December 1994
Citations: 17


High voltage electron microscopy (HVEM) and HVEM tomography of selectively stained cell processes in the neostriatum have offered an alternative to serial thin section reconstruction for accurate 3-D visualization and measurement of axons, dendrites, and dendritic spines. Tissue preparation is simple and rapid, allowing examination of large numbers of specimens required for quantitation of neuronal morphology. The resolution of the images exceeds that available from any light microscopic technique and is appropriate for measurement of the finest axons and dendritic spine necks. HVEM tomography allows the direct measurement of dendritic surface area, required for computational modeling of synaptic integration. © 1994 Wiley-Liss, Inc.